Testing of Digital Systems
Testing of Digital Systems
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$212.00
USDDevice testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
- Most comprehensive book yet on digital systems testing
- Covers all the latest techniques
- Includes System-on-a-Chip testing
Product details
June 2003Hardback
9780521773560
1016 pages
256 × 180 × 49 mm
2.185kg
90 tables
Available
Table of Contents
- 1. Introduction
- 2. Fault models
- 3. Combinational logic and fault simulation
- 4. Test generation for combinational circuits
- 5. Sequential ATPG
- 6. IDDQ testing
- 7. Functional testing
- 8. Delay fault testing
- 9. CMOS testing
- 10. Fault diagnosis
- 11. Design for testability
- 12. Built-in self-test
- 13. Synthesis for testability
- 14. Memory testing
- 15. High-level test synthesis
- 16. System-on-a-chip testing
- Index.
